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ORCID13th ISSRE 2002: Annapolis, MD, USA
- 13th International Symposium on Software Reliability Engineering (ISSRE 2002), 12-15 November 2002, Annapolis, MD, USA. IEEE Computer Society 2002, ISBN 0-7695-1763-3
Session 1A: Testing with Formal Methods
- Grégory Lestiennes, Marie-Claude Gaudel:
Testing Processes from Formal Specifications with Inputs, Outputs and Data Types. 3-14 - Tim Menzies, David Owen, Bojan Cukic
:
Saturation Effects in Testing of Formal Models. 15-26 - Guillaume Lussier, Hélène Waeselynck:
Informal Proof Analysis Towards Testing Enhancement. 27-40
Session 2A: Reliability Modeling
- Wen-Li Wang, Mei-Hwa Chen:
Heterogeneous Software Reliability Modeling. 41-52 - Kirk Sayre, Jesse H. Poore:
A Reliability Estimator for Model Based Software Testing. 53-63 - Swapna S. Gokhale, Kishor S. Trivedi:
Reliability Prediction and Sensitivity Analysis Based on Software Architecture. 64-78
Session 3A: Failure Detection and Recovery
- Reinhard Klemm, Navjot Singh:
Automatic Failure Detection, Logging, and Recovery for High-Availability Java Servers. 79-90 - Subhachandra Chandra, Peter M. Chen:
The Impact of Recovery Mechanisms on the Likelihood of Saving Corrupted State. 91-101 - Christof Fetzer, Zhen Xiao:
A Flexible Generator Architecture for Improving Software Dependability. 102-116
Session 1B: Assessment of Testing
- James Bret Michael, Bernard J. Bossuyt, Byron B. Snyder:
Metrics for Measuring the Effectiveness of Software-Testing Tools. 117-128 - Chin-Yu Huang, Jung-Hua Lo, Sy-Yen Kuo, Michael R. Lyu:
Optimal Allocation of Testing Resources for Modular Software Systems. 129-138 - Osamu Mizuno, Eijiro Shigematsu, Yasunari Takagi, Tohru Kikuno:
On Estimating Testing Effort Needed to Assure Field Quality in Software Development. 139-148
Session 2B: High Availability Software Maintenance
- Lizhou Yu, Gholamali C. Shoja, Hausi A. Müller, Anand Srinivasan:
A Framework for Live Software Upgrade. 149-158 - Yun Liu, Kishor S. Trivedi, Yue Ma, James J. Han, Haim Levendel:
Modeling and Analysis of Software Rejuvenation in Cable Modem Termination Systems. 159-170 - Hiroyuki Okamura, Satoshi Miyahara, Tadashi Dohi:
Dependability Analysis of a Client/Server Software System with Rejuvenation. 171-182
Session 1C: Testing Technologies
- Ponrudee Netisopakul, Lee J. White, John Morris, Daniel Hoffman:
Data Coverage Testing of Programs for Container Classes. 183-194 - Benoit Baudry, Franck Fleurey, Jean-Marc Jézéquel, Yves Le Traon:
Genes and Bacteria for Automatic Test Cases Optimization in the .NET Environment. 195-206 - Roger T. Alexander, Jeff Offutt, James M. Bieman:
Fault Detection Capabilities of Coupling-based OO Testing. 207-220
Session 2C: System Analysis
- Taghi M. Khoshgoftaar:
Improving Usefulness of Software Quality Classification Models Based on Boolean Discriminant Functions. 221-230 - Dingding Lu, Robyn R. Lutz:
Fault Contribution Trees for Product Families. 231-242 - Ganesh J. Pai, Joanne Bechta Dugan:
Automatic Synthesis of Dynamic Fault Trees from UML System Models. 243-256
Session 1D: Practical Experience with Testing
- Marc Fisher II, Dalai Jin, Gregg Rothermel, Margaret M. Burnett:
Test Reuse in the Spreadsheet Paradigm. 257-268 - Giuliano Antoniol, Lionel C. Briand, Massimiliano Di Penta, Yvan Labiche:
A Case Study Using the Round-Trip Strategy for State-Based Class Testing. 269-279 - Satya Kanduri, Sebastian G. Elbaum:
An Empirical Study of Tracing Techniques from a Failure Analysis Perspective. 280-294
Session 2D: Reliability Prediction and Analysis
- Peter G. Bishop, Robin E. Bloomfield:
Worst Case Reliability Prediction Based on a Prior Estimate of Residual Defects. 295-303 - Michael Grottke:
A Vector Markov Model for Structural Coverage Growth and the Number of Failure Occurrences. 304-315 - Yu Lei, Kuo-Chung Tai:
Blocking-based Simultaneous Reachability Analysis of Asynchronous Message-passing Programs. 316-328
Session 1E: Software Mutation
- João Durães, Henrique Madeira:
Emulation of Software Faults by Educated Mutations at Machine-Code Level. 329-340 - Roger T. Alexander, James M. Bieman, Sudipto Ghosh, Bixia Ji:
Mutation of Java Objects. 341-351 - Yu-Seung Ma, Yong Rae Kwon, Jeff Offutt:
Inter-Class Mutation Operators for Java. 352-366
Session 2E: Reliability Assessment
- Farokh B. Bastani, Sung Kim, I-Ling Yen, Ing-Ray Chen:
Reliability Assessment of Framework-Based Distributed Embedded Software Systems. 367-376 - João W. Cangussu, Aditya P. Mathur, Raymond A. DeCarlo:
Effect of Disturbances on the Convergence of Failure Intensity. 377-387 - John C. Munson, Allen P. Nikora:
Toward A Quantifiable Definition of Software Faults. 388-396
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