{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:52:59Z","timestamp":1747806779068,"version":"3.38.0"},"reference-count":17,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2010,12,29]],"date-time":"2010-12-29T00:00:00Z","timestamp":1293580800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2011,6]]},"DOI":"10.1007\/s10836-010-5191-6","type":"journal-article","created":{"date-parts":[[2010,12,28]],"date-time":"2010-12-28T07:09:22Z","timestamp":1293520162000},"page":"267-276","source":"Crossref","is-referenced-by-count":7,"title":["RFID System On-line Testing Based on the Evaluation of the Tags Read-Error-Rate"],"prefix":"10.1007","volume":"27","author":[{"given":"Gilles","family":"Fritz","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincent","family":"Beroulle","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Oum-El-Kheir","family":"Aktouf","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Minh Duc","family":"Nguyen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"H\u00e9ly","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2010,12,29]]},"reference":[{"doi-asserted-by":"crossref","unstructured":"Ahmed N, Kumar R, French RS, Ramachandaran U (2007) RF2ID: a reliable middleware framework for RFID deployment. In: Proc. IEEE International Parallel and Distributed Processing Symposium (IPDPS)","key":"5191_CR1","DOI":"10.1109\/IPDPS.2007.370256"},{"unstructured":"Angerer C, Knerr B, Holzer M, Adalan A, Rupp M (2007) Flexible simulation and prototyping for RFID designs. First International EURASIP Workshop on RFID Technology, pp 51\u201354","key":"5191_CR2"},{"unstructured":"Barbu S (2005) Design and development of a system methodology for 13.56\u00a0MHz \u201ccontactless\u201d systems\u2019RF part. Marne-La-Vall\u00e9e University, France, Thesis","key":"5191_CR3"},{"doi-asserted-by":"crossref","unstructured":"Bolotnyy L, Robins G (2007) The case for multi-tag RFID systems. International Conference on Wireless Algorithms, Systems and Applications, pp 174\u2013186","key":"5191_CR4","DOI":"10.1109\/WASA.2007.10"},{"key":"5191_CR5","doi-asserted-by":"crossref","first-page":"19","DOI":"10.1016\/S0951-8320(03)00174-1","volume":"84","author":"L Cauffriez","year":"2004","unstructured":"Cauffriez L, Ciccotelli J, Conrard B, Bayart M et al (2004) Design of intelligent distributed control systems: a dependability point of view. Reliab Eng Syst Saf 84:19\u201322","journal-title":"Reliab Eng Syst Saf"},{"unstructured":"Das R, Harrop P (2009) RFID forecasts, players and opportunities 2009\u20132019. IdTechEx report","key":"5191_CR6"},{"doi-asserted-by":"crossref","unstructured":"Derakhshan R, Orlowska ME, Li X (2007) RFID data management: challenges and opportunities. 2007 IEEE International Conference on RFID, USA","key":"5191_CR7","DOI":"10.1109\/RFID.2007.346166"},{"unstructured":"EPCGlobal (2006) Reader protocol standard v1.1","key":"5191_CR8"},{"unstructured":"Finkenzeller K (ed) (2003) RFID handbook: fundamentals and applications in contactless smart cards and identification, 2nd edn. John Wiley & Sons \u00a9, ISBN:0470844027","key":"5191_CR9"},{"doi-asserted-by":"crossref","unstructured":"Jacobsen R, Nielsen KF, Popovski P, Larsen T (2009) Reliable identification of RFID tags using multiple independent reader sessions. 2009 IEEE International Conference on RFID, pp 64\u201371, 27\u201328, April","key":"5191_CR10","DOI":"10.1109\/RFID.2009.4911187"},{"issue":"2","key":"5191_CR11","first-page":"81","volume":"50","author":"R Khouri","year":"2007","unstructured":"Khouri R, Beroulle V, Vuong TP, Tedjini S (2007) UHF RFID tag-antenna matching optimization using VHDL-AMS behavioral modelling. Analog Integr Circuits Signal Process, Springer Netherlands 50(2):81\u2013162, ISSN: 0925-1030","journal-title":"Analog Integr Circuits Signal Process, Springer Netherlands"},{"issue":"4","key":"5191_CR12","doi-asserted-by":"crossref","first-page":"363","DOI":"10.1007\/s10836-006-0629-6","volume":"23","author":"M Mohammad","year":"2007","unstructured":"Mohammad M, Terkawi L (2007) Techniques for disturb fault collapsing. J Electron Test Theory Appl 23(4):363\u2013368","journal-title":"J Electron Test Theory Appl"},{"unstructured":"Murfett D, TAGSYS Australia Pty Ltd. The challenge of testing RFID integrated circuits. Proceedings of the Second IEEE International Workshop on Electronic Design, Test and Applications (DELTA\u201904)","key":"5191_CR13"},{"doi-asserted-by":"crossref","unstructured":"Natarajan US, Shanmugasundaram H, Deshpande P, Wah CS (2007) Rapid UHF RFID silicon debug and production testing. ITC 2007, pp 1\u201310, 21\u201326 October","key":"5191_CR14","DOI":"10.1109\/TEST.2007.4437593"},{"doi-asserted-by":"crossref","unstructured":"Negreiros M, Carro L, Susin AA (2007) Reducing test time using an enhanced RF loopback. J Electron Test (JETTA), Special Issue On Analog, Mixed-Signal and Rf Testing 23(6), December","key":"5191_CR15","DOI":"10.1007\/s10836-007-5026-2"},{"doi-asserted-by":"crossref","unstructured":"Sood B, Das D, Azarian M, Pecht M, Bolton B, Lin T (2008) Failure site isolation on passive RFID tags. 15th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, pp 337\u2013341, July 7\u201311","key":"5191_CR16","DOI":"10.1109\/IPFA.2008.4588216"},{"doi-asserted-by":"crossref","unstructured":"Vahedi E, Shah-Mansouri V, Wong VWS, Blake IF (2010) A probabilistic approach for detecting blocking attack in RFID systems. 2010 IEEE International Conference on Communications (ICC), pp 1\u20136, 23\u201327 May","key":"5191_CR17","DOI":"10.1109\/ICC.2010.5502581"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-010-5191-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-010-5191-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-010-5191-6","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T04:33:28Z","timestamp":1740803608000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-010-5191-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,12,29]]},"references-count":17,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2011,6]]}},"alternative-id":["5191"],"URL":"https:\/\/doi.org\/10.1007\/s10836-010-5191-6","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2010,12,29]]}}}