{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:45:35Z","timestamp":1759146335963},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[1994,3,1]],"date-time":"1994-03-01T00:00:00Z","timestamp":762480000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[1994,3]]},"DOI":"10.1109\/43.265677","type":"journal-article","created":{"date-parts":[[2002,8,24]],"date-time":"2002-08-24T17:57:42Z","timestamp":1030211862000},"page":"359-369","source":"Crossref","is-referenced-by-count":77,"title":["Electrical model of the floating gate defect in CMOS ICs: implications on I\/sub DDQ\/ testing"],"prefix":"10.1109","volume":"13","author":[{"given":"V.H.","family":"Champac","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Rubio","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Figueras","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","author":"champac","year":"1993","journal-title":"Caracterizaci\ufffdn del defecto de puerta flotante y su detecci\ufffdn en circuitos CMOS digitales"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1988.122524"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1978.1051123"},{"key":"ref13","doi-asserted-by":"crossref","DOI":"10.21236\/ADA606827","author":"vladimirescu","year":"1980","journal-title":"The simulation of MOS integrated circuits using SPICE2"},{"key":"ref14","year":"1987","journal-title":"SPICE3 User s Guide"},{"key":"ref15","author":"tsividis","year":"1987","journal-title":"Operation and Modeling of the MOS Transistor"},{"key":"ref16","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-7091-9043-2","author":"de graaf","year":"1990","journal-title":"Compact Transistor Modeling for Circuit Design"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(64)90039-5"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/41.19071"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1988.122525"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519522"},{"key":"ref5","first-page":"143","article-title":"Fault modeling of gate oxide short, floating gate and bridging failures in CMOS circuits","author":"champac","year":"1991","journal-title":"Proc European Test Conf"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519713"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"166","DOI":"10.1109\/TCAD.1985.1270112","article-title":"Modeling of lithography related yield losses for CAD of VLSI circuits","volume":"cad 4","author":"maly","year":"1985","journal-title":"IEEE Trans Computer-Aided Design"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/el:19860106"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1978.tb02106.x"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/43.177407"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx1\/43\/6661\/00265677.pdf?arnumber=265677","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:11:23Z","timestamp":1638216683000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/265677\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1994,3]]},"references-count":17,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/43.265677","relation":{},"ISSN":["0278-0070"],"issn-type":[{"value":"0278-0070","type":"print"}],"subject":[],"published":{"date-parts":[[1994,3]]}}}