{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T21:13:31Z","timestamp":1783804411729,"version":"3.55.0"},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,28]],"date-time":"2024-10-28T00:00:00Z","timestamp":1730073600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,28]],"date-time":"2024-10-28T00:00:00Z","timestamp":1730073600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,28]]},"DOI":"10.1109\/issrew63542.2024.00042","type":"proceedings-article","created":{"date-parts":[[2024,12,3]],"date-time":"2024-12-03T13:55:36Z","timestamp":1733234136000},"page":"25-30","source":"Crossref","is-referenced-by-count":1,"title":["Auto-PIP: Real-time Identification of Critical Performance Inflection Points in Software Stress Testing"],"prefix":"10.1109","author":[{"given":"Shenglin","family":"Zhang","sequence":"first","affiliation":[{"name":"Nankai University"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiao","family":"Xiong","sequence":"additional","affiliation":[{"name":"Nankai University"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mengyao","family":"Li","sequence":"additional","affiliation":[{"name":"Nankai University"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yongqian","family":"Sun","sequence":"additional","affiliation":[{"name":"Nankai University"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yongxin","family":"Zhao","sequence":"additional","affiliation":[{"name":"Nankai University"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xia","family":"Chen","sequence":"additional","affiliation":[{"name":"Huawei Cloud"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bowen","family":"Deng","sequence":"additional","affiliation":[{"name":"Huawei Cloud"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Dan","family":"Pei","sequence":"additional","affiliation":[{"name":"Tsinghua University, Beijing National Research Center for Information Science and Technology"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2022.01.130"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2895052"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2015.2445340"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.18178\/ijfcc.2019.8.2.537"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/HASE.2019.00035"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICC.2018.8422781"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.2528\/PIERB13030304"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1186\/s40537-021-00518-7"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/PCCC.2018.8711315"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNSM.2019.2919327"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3083060"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.2147\/CLEP.S176723"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/rs12061008"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-12-815739-8.00006-7"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.38094\/jastt20165"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/UBMK50275.2020.9219482"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.nmni.2020.100795"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3178876.3185996"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/PCCC.2018.8710885"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/INFOCOM.2019.8737430"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1561\/2200000056"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.5194\/amt-13-6945-2020"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3097983.3098144"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33483-2"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISRITI.2018.8864455"}],"event":{"name":"2024 IEEE 35th International Symposium on Software Reliability Engineering Workshops (ISSREW)","location":"Tsukuba, Japan","start":{"date-parts":[[2024,10,28]]},"end":{"date-parts":[[2024,10,31]]}},"container-title":["2024 IEEE 35th International Symposium on Software Reliability Engineering Workshops (ISSREW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10771160\/10771165\/10771391.pdf?arnumber=10771391","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T18:33:01Z","timestamp":1762281181000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10771391\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,28]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/issrew63542.2024.00042","relation":{},"subject":[],"published":{"date-parts":[[2024,10,28]]}}}