{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,12,5]],"date-time":"2024-12-05T05:14:56Z","timestamp":1733375696270,"version":"3.30.1"},"reference-count":36,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,28]],"date-time":"2024-10-28T00:00:00Z","timestamp":1730073600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,28]],"date-time":"2024-10-28T00:00:00Z","timestamp":1730073600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004750","name":"Aeronautical Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004750","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,28]]},"DOI":"10.1109\/issrew63542.2024.00072","type":"proceedings-article","created":{"date-parts":[[2024,12,3]],"date-time":"2024-12-03T18:55:36Z","timestamp":1733252136000},"page":"143-150","source":"Crossref","is-referenced-by-count":0,"title":["Towards Mutation Testing of Embedded Software: A Framework and Case Study"],"prefix":"10.1109","author":[{"given":"Wei","family":"Jiang","sequence":"first","affiliation":[{"name":"China Electronics Technology Group Corporation,Information Science Academy,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sijin","family":"Dong","sequence":"additional","affiliation":[{"name":"University of Science and Technology Beijing,School of Computer and Communication Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiaming","family":"Zhang","sequence":"additional","affiliation":[{"name":"University of Science and Technology Beijing,School of Computer and Communication Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jin","family":"Tang","sequence":"additional","affiliation":[{"name":"University of Science and Technology Beijing,School of Computer and Communication Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zichao","family":"Zhang","sequence":"additional","affiliation":[{"name":"China Electronics Technology Group Corporation,Information Science Academy,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chang-ai","family":"Sun","sequence":"additional","affiliation":[{"name":"University of Science and Technology Beijing,School of Computer and Communication Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaoyi","family":"Zhang","sequence":"additional","affiliation":[{"name":"University of Science and Technology Beijing,School of Computer and Communication Engineering,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3387730"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAS.2007.4406523"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/0471722324"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2018.06.016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.14569\/IJACSA.2012.030603"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.56"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/C-M.1978.218136"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3597503.3639179"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.30574\/wjarr.2024.21.2.0420"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/AST.2007.8"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2019.8741790"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2005.1553583"},{"key":"ref13","article-title":"Design of mutant operators for the c programming language","volume-title":"Tech. Rep. Technical Report SERC-TR-41-P","author":"Agrawal","year":"1989"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/32.910859"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/bs.adcom.2018.03.015"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2017.61"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE-Companion52605.2021.00063"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MODELS-C59198.2023.00015"},{"issue":"9","key":"ref19","first-page":"3407","article-title":"DFSampling: Mutant reduction technique guided by data flow analysis","volume":"33","author":"Sun","year":"2022","journal-title":"Journal of Software"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2009.04.016"},{"issue":"07","key":"ref21","first-page":"1409","article-title":"CWMT: A concurrency based acceleration technique for weak mutation testing","volume":"46","author":"Sun","year":"2023","journal-title":"Chinese Journal of Computers"},{"issue":"1","key":"ref22","first-page":"112","article-title":"Research review of embedded software testing","volume":"51","author":"Yang","year":"2021","journal-title":"Aeronautical Computing Technique"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2006.113"},{"issue":"2\u20133","key":"ref24","first-page":"119","article-title":"An analysis of the coupling effect i: single test data","volume":"48","author":"Wah","year":"2003","journal-title":"Science of Computer Programming"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/125489.125473"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/227607.227610"},{"issue":"1","key":"ref27","first-page":"44","article-title":"A data flow analysis based redundant mutants identification technique","volume":"42","author":"Sun","year":"2019","journal-title":"Chinese Journal of Computers"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/302405.302640"},{"issue":"01","key":"ref29","first-page":"17","article-title":"Embedded software testing methods based on modular design","volume":"5","author":"Guo","year":"2005","journal-title":"Microcontrollers and Embedded Systems"},{"issue":"4","key":"ref30","first-page":"87","article-title":"Simulation and modeling for embedded software test","volume":"34","author":"Jiang","year":"2008","journal-title":"Computer Engineering"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/2.585157"},{"key":"ref32","article-title":"Vulnerability testing of software system using fault injection","volume-title":"Tech. Rep. COAST TR 98 - 02","author":"Du","year":"1998"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1992.243567"},{"issue":"11","key":"ref34","first-page":"1910","article-title":"An approach for identifying software vulnerabilities based on error propagation analysis","volume":"30","author":"Li","year":"2007","journal-title":"Chinese Journal of Computers"},{"issue":"08","key":"ref35","first-page":"2991","article-title":"Framework and realization of embedded software safety-testing based on fault injection","volume":"29","author":"Wang","year":"2012","journal-title":"Application Research of Computers"},{"issue":"4","key":"ref36","first-page":"1080","article-title":"A logic coverage test method research for embedded software","volume":"23","author":"Xiao","year":"2015","journal-title":"Computer Measurement and Control"}],"event":{"name":"2024 IEEE 35th International Symposium on Software Reliability Engineering Workshops (ISSREW)","start":{"date-parts":[[2024,10,28]]},"location":"Tsukuba, Japan","end":{"date-parts":[[2024,10,31]]}},"container-title":["2024 IEEE 35th International Symposium on Software Reliability Engineering Workshops (ISSREW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10771160\/10771165\/10771238.pdf?arnumber=10771238","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,4]],"date-time":"2024-12-04T06:57:58Z","timestamp":1733295478000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10771238\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,28]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/issrew63542.2024.00072","relation":{},"subject":[],"published":{"date-parts":[[2024,10,28]]}}}