{"id":"https://openalex.org/W2560974353","doi":"https://doi.org/10.1109/gcce.2016.7800384","title":"The circuit design of area short-wave infrared cameras and adaptive strategies for reducing electromagnetic interference","display_name":"The circuit design of area short-wave infrared cameras and adaptive strategies for reducing electromagnetic interference","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2560974353","doi":"https://doi.org/10.1109/gcce.2016.7800384","mag":"2560974353"},"language":"en","primary_location":{"id":"doi:10.1109/gcce.2016.7800384","is_oa":false,"landing_page_url":"https://doi.org/10.1109/gcce.2016.7800384","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 5th Global Conference on Consumer Electronics","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050638014","display_name":"Rui-Cian Weng","orcid":"https://orcid.org/0000-0001-5652-4821"},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Institutes of Applied Research","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Rui-Cian Weng","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111546144","display_name":"Tai-Shan Liao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Institutes of Applied Research","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tai-Shan Liao","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027741504","display_name":"Chi-Hung Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Institutes of Applied Research","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chi-Hung Wang","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210166867"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"2","issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.7576931715011597},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.7045708298683167},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6490746140480042},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5128002762794495},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.49367555975914},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.48340192437171936},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4193474352359772},{"id":"https://openalex.org/keywords/electromagnetic-field","display_name":"Electromagnetic field","score":0.4132674038410187},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4051671624183655},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.3420878052711487},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24763065576553345},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.15982821583747864},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12573516368865967}],"concepts":[{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.7576931715011597},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.7045708298683167},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6490746140480042},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5128002762794495},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.49367555975914},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.48340192437171936},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4193474352359772},{"id":"https://openalex.org/C28843909","wikidata":"https://www.wikidata.org/wiki/Q177625","display_name":"Electromagnetic field","level":2,"score":0.4132674038410187},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4051671624183655},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.3420878052711487},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24763065576553345},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.15982821583747864},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12573516368865967},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/gcce.2016.7800384","is_oa":false,"landing_page_url":"https://doi.org/10.1109/gcce.2016.7800384","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 5th Global Conference on Consumer Electronics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1975063811","https://openalex.org/W2117923632","https://openalex.org/W2589184076"],"related_works":["https://openalex.org/W2108494335","https://openalex.org/W2375786911","https://openalex.org/W2013460191","https://openalex.org/W76001227","https://openalex.org/W4308096053","https://openalex.org/W2367630196","https://openalex.org/W2385012059","https://openalex.org/W756944427","https://openalex.org/W4230660276","https://openalex.org/W2761392055"],"abstract_inverted_index":{"In":[0,36,53],"this":[1,54],"study,":[2,55],"an":[3],"area":[4],"short-wave":[5],"infrared":[6],"camera":[7],"circuit":[8,14,19,58],"design":[9,59],"was":[10,61],"introduced.":[11,62],"When":[12],"developing":[13],"designs,":[15],"the":[16,22,64,73,86,95,101],"influence":[17],"of":[18],"designs":[20],"on":[21],"surrounding":[23],"components":[24],"and":[25,43,81],"vice":[26],"versa":[27],"is":[28],"a":[29,56],"critical":[30],"concern":[31],"that":[32,49,94],"must":[33,50],"be":[34,51,69],"considered.":[35],"addition,":[37],"electromagnetic":[38,87],"interference,":[39],"video":[40],"signal":[41],"integrity,":[42],"zero":[44],"video-quality":[45],"interference":[46,88],"are":[47],"factors":[48],"addressed.":[52],"hardware":[57],"architecture":[60],"Because":[63],"cameras":[65],"were":[66,90,97],"required":[67],"to":[68,75,85],"set":[70],"up":[71],"in":[72,98],"air":[74],"take":[76],"aerial":[77],"videos,":[78],"airline-related":[79],"laws":[80],"near-field":[82],"experiments":[83],"related":[84],"tests":[89],"compared.":[91],"Which":[92],"revealed":[93],"system":[96],"accordance":[99],"with":[100],"aforementioned":[102],"laws.":[103]},"counts_by_year":[],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}