{"id":"https://openalex.org/W2098935164","doi":"https://doi.org/10.1145/988952.989017","title":"A practical approach to modeling skin effect in on-chip interconnects","display_name":"A practical approach to modeling skin effect in on-chip interconnects","publication_year":2004,"publication_date":"2004-04-26","ids":{"openalex":"https://openalex.org/W2098935164","doi":"https://doi.org/10.1145/988952.989017","mag":"2098935164"},"language":"en","primary_location":{"id":"doi:10.1145/988952.989017","is_oa":false,"landing_page_url":"https://doi.org/10.1145/988952.989017","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 14th ACM Great Lakes symposium on VLSI","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033953217","display_name":"Bhaskar Mukherjee","orcid":"https://orcid.org/0000-0003-2077-6976"},"institutions":[{"id":"https://openalex.org/I59553526","display_name":"Stony Brook University","ror":"https://ror.org/05qghxh33","country_code":"US","type":"education","lineage":["https://openalex.org/I59553526"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bhaskar Mukherjee","raw_affiliation_strings":["Stony Brook University, Stony Brook, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Stony Brook University, Stony Brook, NY","institution_ids":["https://openalex.org/I59553526"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100435844","display_name":"Lei Wang","orcid":"https://orcid.org/0000-0002-0806-9075"},"institutions":[{"id":"https://openalex.org/I59553526","display_name":"Stony Brook University","ror":"https://ror.org/05qghxh33","country_code":"US","type":"education","lineage":["https://openalex.org/I59553526"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lei Wang","raw_affiliation_strings":["Stony Brook University, Stony Brook, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Stony Brook University, Stony Brook, NY","institution_ids":["https://openalex.org/I59553526"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029785530","display_name":"A. Pacelli","orcid":null},"institutions":[{"id":"https://openalex.org/I59553526","display_name":"Stony Brook University","ror":"https://ror.org/05qghxh33","country_code":"US","type":"education","lineage":["https://openalex.org/I59553526"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrea Pacelli","raw_affiliation_strings":["Stony Brook University, Stony Brook, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Stony Brook University, Stony Brook, NY","institution_ids":["https://openalex.org/I59553526"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I59553526"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"266","last_page":"270"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6648659110069275},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6581900715827942},{"id":"https://openalex.org/keywords/network-topology","display_name":"Network topology","score":0.6520097255706787},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5929433107376099},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5452043414115906},{"id":"https://openalex.org/keywords/skin-effect","display_name":"Skin effect","score":0.48812708258628845},{"id":"https://openalex.org/keywords/transfer-function","display_name":"Transfer function","score":0.487416535615921},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.48190122842788696},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.4652503430843353},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.4638884663581848},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.45981061458587646},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.457985520362854},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.4317842423915863},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19820719957351685},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1894150674343109},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1070505678653717}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6648659110069275},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6581900715827942},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.6520097255706787},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5929433107376099},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5452043414115906},{"id":"https://openalex.org/C151482245","wikidata":"https://www.wikidata.org/wiki/Q664150","display_name":"Skin effect","level":2,"score":0.48812708258628845},{"id":"https://openalex.org/C81299745","wikidata":"https://www.wikidata.org/wiki/Q334269","display_name":"Transfer function","level":2,"score":0.487416535615921},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.48190122842788696},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.4652503430843353},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.4638884663581848},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.45981061458587646},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.457985520362854},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.4317842423915863},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19820719957351685},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1894150674343109},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1070505678653717},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/988952.989017","is_oa":false,"landing_page_url":"https://doi.org/10.1145/988952.989017","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 14th ACM Great Lakes symposium on VLSI","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320338294","display_name":"Air Force Research Laboratory","ror":"https://ror.org/02e2egq70"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1483158368","https://openalex.org/W1502398503","https://openalex.org/W2012845491","https://openalex.org/W2032977447","https://openalex.org/W2070420940","https://openalex.org/W2072698610","https://openalex.org/W2078013997","https://openalex.org/W2101875550","https://openalex.org/W2132593499","https://openalex.org/W2140527215","https://openalex.org/W2141500592","https://openalex.org/W2157763958","https://openalex.org/W2160740950","https://openalex.org/W6628990838","https://openalex.org/W6680724763"],"related_works":["https://openalex.org/W2371304091","https://openalex.org/W2086397253","https://openalex.org/W2057519612","https://openalex.org/W2096441037","https://openalex.org/W2047130476","https://openalex.org/W2313177381","https://openalex.org/W2135245481","https://openalex.org/W1495269561","https://openalex.org/W2548390774","https://openalex.org/W4386855312"],"abstract_inverted_index":{"A":[0,37],"compact":[1],"modeling":[2],"methodology":[3],"for":[4,59,75,87],"the":[5,31,42,46,73,77,96],"skin":[6],"effect":[7],"in":[8],"conductors":[9],"with":[10],"rectangular":[11],"cross":[12],"section":[13],"is":[14,28,53,84,103],"presented.":[15,104],"Possible":[16],"equivalent":[17],"circuit":[18],"topologies":[19],"are":[20],"reviewed,":[21],"and":[22,80],"their":[23],"calibration":[24,35],"on":[25,41],"numerical":[26,51],"simulation":[27],"discussed,":[29],"highlighting":[30],"shortcomings":[32],"of":[33,45,63,95],"conventional":[34],"procedures.":[36],"new":[38,69],"approach,":[39],"based":[40],"direct":[43],"fitting":[44],"impedance":[47],"transfer":[48],"function":[49],"to":[50,55],"simulations,":[52],"shown":[54],"offer":[56],"excellent":[57],"accuracy":[58],"a":[60,85,92],"wide":[61],"range":[62],"cross-sectional":[64],"wire":[65,78],"aspect":[66],"ratios.":[67],"The":[68],"formulation":[70],"also":[71],"obviates":[72],"need":[74],"separating":[76],"internal":[79],"external":[81],"inductances":[82],"which":[83],"prerequisite":[86],"all":[88],"published":[89],"models.":[90],"Finally,":[91],"practical":[93],"implementation":[94],"model":[97],"as":[98],"an":[99],"RL":[100],"parallel":[101],"network":[102]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}