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ORCIDIEEE Transactions on Reliability, Volume 56
Volume 56, Number 1, March 2007
- Jason W. Rupe:
Editorial - IEEE Editors Survey on the Features of Accepted Papers. 2-9 - Yi-Kuei Lin:
Reliability of a Flow Network Subject to Budget Constraints. 10-16 - Yi-Kuei Lin:
System Reliability of a Limited-Flow Network in Multicommodity Case. 17-25 - Manju Agarwal, Kanwar Sen, Pooja Mohan:
GERT Analysis of m-Consecutive-k-Out-of-n Systems. 26-34 - Serkan Eryilmaz
:
On the Lifetime Distribution of Consecutive -out-of-n: F System. 35-39 - Huairui Guo, Haitao Liao, Wenbiao Zhao, Adamantios Mettas:
A New Stochastic Model for Systems Under General Repairs. 40-49 - Kin-Ping Hui:
Monte Carlo Network Reliability Ranking Estimation. 50-57 - Liudong Xing:
Reliability Evaluation of Phased-Mission Systems With Imperfect Fault Coverage and Common-Cause Failures. 58-68 - Wei-Ting Kary Chien, Siyuan Frank Yang:
A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing. 69-76 - Chenhua Li, Nasser Fard:
Optimum Bivariate Step-Stress Accelerated Life Test for Censored Data. 77-84 - Francis G. Pascual:
Accelerated Life Test Planning With Independent Weibull Competing Risks With Known Shape Parameter. 85-93 - J. Onishi, S. Kimura, Ross J. W. James, Yuji Nakagawa:
Solving the Redundancy Allocation Problem With a Mix of Components Using the Improved Surrogate Constraint Method. 94-101 - B. M. Golam Kibria, Saralees Nadarajah:
Reliability Modeling: Linear Combination and Ratio of Exponential and Rayleigh. 102-105 - Furong Tan, Zhibin Jiang, Suk Joo Bae:
Generalized Linear Mixed Models for Reliability Analysis of Multi-Copy Repairable Systems. 106-114 - Noyan Turkkan, Thu Pham-Gia:
System Stress-Strength Reliability: The Multivariate Case. 115-124 - J. Nierwinski:
Reliability Sampling Methodology Using Simulation and Re-Sampling. 125-131 - Ammar M. Sarhan:
Analysis of Incomplete, Censored Data in Competing Risks Models With Generalized Exponential Distributions. 132-138 - Le-Ren Chang-Chien, Yin-Juin Lin, Chin-Chung Wu:
A Real-Time Contingency Reserve Scheduling for an Isolated Power System. 139-147 - Gregory Levitin:
Optimal Defense Strategy Against Intentional Attacks. 148-157 - Massimiliano Giorgio, Maurizio Guida, Gianpaolo Pulcini:
A Wear Model for Assessing the Reliability of Cylinder Liners in Marine Diesel Engines. 158-166 - Jason W. Rupe:
Review of Optimal Reliability Design, Fundamentals and Applications. 167 - Jason W. Rupe:
Review of Reliability of Large Scale Systems. 167-168 - Way Kuo:
Corrections to "Challenges Related to Reliability in Nano Electronics". 169
Volume 56, Number 2, June 2007
- Way Kuo:
Editorial: How Reliable is Teaching Evaluation? The Relationship of Class Size to Teaching Evaluation Scores. 178-181 - George R. Roelke, Rusty O. Baldwin, Barry E. Mullins, Yong C. Kim:
A Cache Architecture for Extremely Unreliable Nanotechnologies. 182-197 - Chin-Yu Huang, Sy-Yen Kuo, Michael R. Lyu:
An Assessment of Testing-Effort Dependent Software Reliability Growth Models. 198-211 - Taghi M. Khoshgoftaar, Kehan Gao:
Count Models for Software Quality Estimation. 212-222 - Kehan Gao, Taghi M. Khoshgoftaar:
A Comprehensive Empirical Study of Count Models for Software Fault Prediction. 223-236 - Taghi M. Khoshgoftaar, Yi Liu:
A Multi-Objective Software Quality Classification Model Using Genetic Programming. 237-245 - Babu Zachariah, R. N. Rattihalli:
Failure Size Proportional Models and an Analysis of Failure Detection Abilities of Software Testing Strategies. 246-253 - Changcheng Huang, Minzhe Li, Anand Srinivasan:
A Scalable Path Protection Mechanism for Guaranteed Network Reliability Under Multiple Failures. 254-267 - Li Bai:
Generalized Access Structure Congestion System. 268-274 - Dirk P. Kroese, Kin-Ping Hui, Sho Nariai:
Network Reliability Optimization via the Cross-Entropy Method. 275-287 - Sy-Yen Kuo, Fu-Min Yeh, Hung-Yau Lin:
Efficient and Exact Reliability Evaluation for Networks With Imperfect Vertices. 288-300 - Narayanaswamy Balakrishnan, Arezou Habibi Rad, Naser Reza Arghami:
Testing Exponentiality Based on Kullback-Leibler Information With Progressively Type-II Censored Data. 301-307 - Theodora Dimitrakopoulou, Konstantinos Adamidis, Sotirios Loukas:
A Lifetime Distribution With an Upside-Down Bathtub-Shaped Hazard Function. 308-311 - Ammar M. Sarhan, Frank M. Guess, John S. Usher:
Estimators for Reliability Measures in Geometric Distribution Model Using Dependent Masked System Life Test Data. 312-320 - Yefim Haim Michlin, Genady Grabarnik:
Sequential Testing for Comparison of the Mean Time Between Failures for Two Systems. 321-331 - Ali Haj Shirmohammadi, Zhe George Zhang, Ernie Love:
A Computational Model for Determining the Optimal Preventive Maintenance Policy With Random Breakdowns and Imperfect Repairs. 332-339 - Zehui Li, Peng Zhao:
Reliability Analysis on the delta-Shock Model of Complex Systems. 340-348 - Michael J. LuValle:
Identifying Mechanisms That Highly Accelerated Tests Miss. 349-359 - Juan A. Carrasco:
Corrections on "Failure Transition Distance-Based Importance Sampling Schemes for the Simulation of Repairable Fault-Tolerant Computer Systems" [Jun 06 207-236]. 360 - Mark P. Kaminskiy, Vasiliy V. Krivtsov, Saralees Nadarajah:
Erratum [Dec 05 612-616]. 360
Volume 56, Number 3, September 2007
- Way Kuo, Jason W. Rupe:
R-Impact: Reliability-Based Citation Impact Factor. 366-367 - Min-Hsiung Hsieh, Shuen-Lin Jeng:
Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides. 369-380 - Chong Zhao, Xiaoliang Bai, Sujit Dey:
Evaluating Transient Error Effects in Digital Nanometer Circuits. 381-391 - Suk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam:
Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices. 392-400 - Shuen-Lin Jeng, Jye-Chyi Lu, Kaibo Wang:
A Review of Reliability Research on Nanotechnology. 401-410 - Wen-Li Wang, Thomas L. Hemminger, Mei-Huei Tang:
A Moving Average Non-Homogeneous Poisson Process Reliability Growth Model to Account for Software with Repair and System Structures. 411-421 - Eduardo Oliveira Costa, Gustavo A. de Souza, Aurora Trinidad Ramirez Pozo, Silvia Regina Vergilio:
Exploring Genetic Programming and Boosting Techniques to Model Software Reliability. 422-434 - Lixuan Lu, Jin Jiang:
Joint Failure Importance for Noncoherent Fault Trees. 435-443 - Yuan-Shun Dai, Gregory Levitin:
Optimal Resource Allocation for Maximizing Performance and Reliability in Tree-Structured Grid Services. 444-453 - Hoang Pham, Chin-Diew Lai:
On Recent Generalizations of the Weibull Distribution. 454-458 - William J. Owen:
An Exponential Damage Model for Strength of Fibrous Composite Materials. 459-463 - Albert F. Myers:
k-out-of-n: G System Reliability With Imperfect Fault Coverage. 464-473 - Jose Emmanuel Ramirez-Marquez, Bethel A. Gebre:
A Classification Tree Based Approach for the Development of Minimal Cut and Path Vectors of a Capacitated Network. 474-487 - Weichang Yeh:
A Simple Heuristic Algorithm for Generating All Minimal Paths. 488-494 - Li Bai, Fan Zheng:
Ternary State Circular Sequential k-out-of-n Congestion System. 495-505 - Gary Hardy, Corinne Lucet, Nikolaos Limnios:
K-Terminal Network Reliability Measures With Binary Decision Diagrams. 506-515 - Xian Zhao, Lirong Cui, Way Kuo:
Reliability for Sparsely Connected Consecutive-k Systems. 516-524 - Gerard L. Reijns, Arjan J. C. van Gemund:
Reliability Analysis of Hierarchical Systems Using Statistical Moments. 525-533 - Bhupender Parashar, Gulshan Taneja:
Reliability and Profit Evaluation of a PLC Hot Standby System Based on a Master-Slave Concept and Two Types of Repair Facilities. 534-539 - Dazhi Wang, Kishor S. Trivedi:
Reliability Analysis of Phased-Mission System With Independent Component Repairs. 540-551 - Shaomin Wu, Min Xie:
Classifying Weak, and Strong Components Using ROC Analysis With Application to Burn-In. 552-561 - Tsong Yueh Chen, Robert G. Merkel:
Quasi-Random Testing. 562-568 - Hai-Yan Xu, He-Liang Fei:
Planning Step-Stress Accelerated Life Tests With Two Experimental Variables. 569-579
Volume 56, Number 4, December 2007
- Way Kuo:
Compatibility and Simplicity: The Fundamentals of Reliability. 585-586 - Jérôme Collet:
Correction to "Some Remarks on Rare-Event Approximation". 587 - Ming-Wei Wu, Yi-Min Wang, Sy-Yen Kuo, Yennun Huang:
Self-Healing Spyware: Detection, and Remediation. 588-596 - Long Wang, Zbigniew Kalbarczyk, Weining Gu, Ravishankar K. Iyer:
Reliability MicroKernel: Providing Application-Aware Reliability in the OS. 597-614 - Günther A. Hoffmann, Kishor S. Trivedi, Miroslaw Malek:
A Best Practice Guide to Resource Forecasting for Computing Systems. 615-628 - Y. P. Wu, Q. P. Hu, Min Xie, Szu Hui Ng:
Modeling and Analysis of Software Fault Detection and Correction Process by Considering Time Dependency. 629-642 - W. Douglas Obal II, Michael G. McQuinn, William H. Sanders:
Detecting and Exploiting Symmetry in Discrete-State Markov Models. 643-654
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