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<dblpperson name="Giuseppe Garozzo" pid="333/8128" n="5">
<person key="homepages/333/8128" mdate="2022-11-21">
<author pid="333/8128">Giuseppe Garozzo</author>
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<r><article key="journals/tc/FilipponiSABCGGITB26" mdate="2026-06-01">
<author orcid="0000-0002-1436-3764" pid="323/7030">Gabriele Filipponi</author>
<author orcid="0000-0002-6763-2948" pid="322/3492">Denis Schwachhofer</author>
<author orcid="0000-0003-2978-1130" pid="323/7047">Francesco Angione</author>
<author orcid="0009-0000-0274-5346" pid="265/8996">Claudia Bertani</author>
<author orcid="0000-0002-8746-4398" pid="29/9273">Simone Corbellini</author>
<author orcid="0009-0008-7523-0229" pid="348/8560">Nicola Di Gruttola Giardino</author>
<author orcid="0009-0000-3159-4495" pid="333/8128">Giuseppe Garozzo</author>
<author orcid="0000-0001-6316-4123" pid="304/4004">Giorgio Insinga</author>
<author orcid="0000-0001-7959-0784" pid="06/3">Vincenzo Tancorre</author>
<author orcid="0000-0002-0985-9327" pid="61/78-2">Paolo Bernardi 0002</author>
<title>Netlist-Independent Functional Stress Pattern Generation Strategy for AI HW Accelerators Embedded into SoCs.</title>
<pages>554-566</pages>
<year>2026</year>
<month>February</month>
<volume>75</volume>
<journal>IEEE Trans. Computers</journal>
<number>2</number>
<ee type="oa">https://doi.org/10.1109/TC.2025.3627803</ee>
<url>db/journals/tc/tc75.html#FilipponiSABCGGITB26</url>
<stream>streams/journals/tc</stream>
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<r><article key="journals/tc/IariaBBCGT25" mdate="2026-06-01">
<author orcid="0000-0002-4018-3820" pid="332/0701">Giusy Iaria</author>
<author orcid="0000-0002-0985-9327" pid="61/78-2">Paolo Bernardi 0002</author>
<author orcid="0009-0000-0274-5346" pid="265/8996">Claudia Bertani</author>
<author orcid="0009-0008-7553-4839" pid="348/3238">Lorenzo Cardone</author>
<author orcid="0009-0000-3159-4495" pid="333/8128">Giuseppe Garozzo</author>
<author orcid="0000-0001-7959-0784" pid="06/3">Vincenzo Tancorre</author>
<title>A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs.</title>
<pages>1278-1292</pages>
<year>2025</year>
<month>April</month>
<volume>74</volume>
<journal>IEEE Trans. Computers</journal>
<number>4</number>
<ee type="oa">https://doi.org/10.1109/TC.2024.3521246</ee>
<url>db/journals/tc/tc74.html#IariaBBCGT25</url>
<stream>streams/journals/tc</stream>
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<r><inproceedings key="conf/iolts/BernardiCIAGT23" mdate="2026-06-01">
<author pid="61/78-2">Paolo Bernardi 0002</author>
<author pid="348/3238">Lorenzo Cardone</author>
<author orcid="0000-0002-4018-3820" pid="332/0701">Giusy Iaria</author>
<author pid="67/1250">Davide Appello</author>
<author pid="333/8128">Giuseppe Garozzo</author>
<author pid="06/3">Vincenzo Tancorre</author>
<title>About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics.</title>
<pages>1-7</pages>
<year>2023</year>
<booktitle>IOLTS</booktitle>
<ee>https://doi.org/10.1109/IOLTS59296.2023.10224897</ee>
<crossref>conf/iolts/2023</crossref>
<url>db/conf/iolts/iolts2023.html#BernardiCIAGT23</url>
</inproceedings>
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<r><inproceedings key="conf/itc/FilipponiIRAGT22" mdate="2024-10-06">
<author orcid="0000-0002-1436-3764" pid="323/7030">Gabriele Filipponi</author>
<author orcid="0000-0002-4018-3820" pid="332/0701">Giusy Iaria</author>
<author orcid="0000-0003-2899-7669" pid="r/MatteoSonzaReorda">Matteo Sonza Reorda</author>
<author pid="67/1250">Davide Appello</author>
<author pid="333/8128">Giuseppe Garozzo</author>
<author pid="06/3">Vincenzo Tancorre</author>
<title>In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip.</title>
<pages>646-649</pages>
<year>2022</year>
<booktitle>ITC</booktitle>
<ee>https://doi.org/10.1109/ITC50671.2022.00090</ee>
<crossref>conf/itc/2022</crossref>
<url>db/conf/itc/itc2022.html#FilipponiIRAGT22</url>
</inproceedings>
</r>
<r><inproceedings key="conf/latw/IariaABRAGT22" mdate="2026-06-01">
<author orcid="0000-0002-4018-3820" pid="332/0701">Giusy Iaria</author>
<author orcid="0000-0003-2978-1130" pid="323/7047">Francesco Angione</author>
<author pid="61/78-2">Paolo Bernardi 0002</author>
<author orcid="0000-0003-2899-7669" pid="r/MatteoSonzaReorda">Matteo Sonza Reorda</author>
<author pid="67/1250">Davide Appello</author>
<author pid="333/8128">Giuseppe Garozzo</author>
<author pid="06/3">Vincenzo Tancorre</author>
<title>A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip.</title>
<pages>1-6</pages>
<year>2022</year>
<booktitle>LATS</booktitle>
<ee>https://doi.org/10.1109/LATS57337.2022.9936975</ee>
<crossref>conf/latw/2022</crossref>
<url>db/conf/latw/lats2022.html#IariaABRAGT22</url>
</inproceedings>
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<co c="0"><na f="a/Appello:Davide" pid="67/1250">Davide Appello</na></co>
<co c="0"><na f="b/Bernardi_0002:Paolo" pid="61/78-2">Paolo Bernardi 0002</na></co>
<co c="0"><na f="b/Bertani:Claudia" pid="265/8996">Claudia Bertani</na></co>
<co c="0"><na f="c/Cardone:Lorenzo" pid="348/3238">Lorenzo Cardone</na></co>
<co c="0"><na f="c/Corbellini:Simone" pid="29/9273">Simone Corbellini</na></co>
<co c="0"><na f="f/Filipponi:Gabriele" pid="323/7030">Gabriele Filipponi</na></co>
<co c="0"><na f="g/Giardino:Nicola_Di_Gruttola" pid="348/8560">Nicola Di Gruttola Giardino</na></co>
<co c="0"><na f="i/Iaria:Giusy" pid="332/0701">Giusy Iaria</na></co>
<co c="0"><na f="i/Insinga:Giorgio" pid="304/4004">Giorgio Insinga</na></co>
<co c="0"><na f="r/Reorda:Matteo_Sonza" pid="r/MatteoSonzaReorda">Matteo Sonza Reorda</na></co>
<co c="0"><na f="s/Schwachhofer:Denis" pid="322/3492">Denis Schwachhofer</na></co>
<co c="0"><na f="t/Tancorre:Vincenzo" pid="06/3">Vincenzo Tancorre</na></co>
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