Phase-adjustable error detection flip-flops with 2-stage hold-driven optimization, slack-based grouping scheme and slack distribution control for dynamic voltage scaling.

Tadao Yamanaka

Masanori Kurimoto Hiroaki Suzuki Rei Akiyama Tadao Yamanaka Haruyuki Ohkuma Hidehiro Takata Hirofumi Shinohara Phase-adjustable error detection flip-flops with 2-stage hold-driven optimization, slack-based grouping scheme and slack distribution control for dynamic voltage scaling. 2010 15 ACM Trans. Design Autom. Electr. Syst. 2 https://doi.org/10.1145/1698759.1698767 https://www.wikidata.org/entity/Q130974624 db/journals/todaes/todaes15.html#KurimotoSAYOTS10 17:1-17:17

Masanori Kurimoto Hiroaki Suzuki Rei Akiyama Tadao Yamanaka Haruyuki Ohkuma Hidehiro Takata Hirofumi Shinohara Phase-adjustable error detection flip-flops with 2-stage hold driven optimization and slack based grouping scheme for dynamic voltage scaling. 884-889 2008 DAC https://doi.org/10.1145/1391469.1391692 conf/dac/2008 db/conf/dac/dac2008.html#KurimotoSAYOTS08 Hiroaki Suzuki Masanori Kurimoto Tadao Yamanaka Hidehiro Takata Hiroshi Makino Hirofumi Shinohara Post-silicon programmed body-biasing platform suppressing device variability in 45 nm CMOS technology. 15-20 2008 ISLPED https://doi.org/10.1145/1393921.1393931 conf/islped/2008 db/conf/islped/islped2008.html#SuzukiKYTMS08 Rei Akiyama Masanori Kurimoto Hiroshi Makino Haruyuki Ohkuma Hirofumi Shinohara Hiroaki Suzuki Hidehiro Takata