Blaise Ravelo Alexandre Douyère Yang Liu 0003 Wenceslas Rahajandraibe Fayu Wan George Chan Mathieu Guerin Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test. 96-104 2023 February 40 IEEE Des. Test 1 https://doi.org/10.1109/MDAT.2022.3164337 db/journals/dt/dt40.html#RaveloDLRWCG23