SET and noise fault tolerant circuit design techniques: Application to 7nm FinFET (Q59275484)
article published in 2014
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| English | SET and noise fault tolerant circuit design techniques: Application to 7nm FinFET |
article published in 2014 |
Statements
SET and noise fault tolerant circuit design techniques: Application to 7nm FinFET (English)
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April 2014
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54
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4
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738-745
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