Satyajit Wattamwar
Satyajit Wattamwar
Siep Weiland
Ton Backx
State Information based Identification Methods towards Low Order Modeling.
665-670
2010
CCA
https://doi.org/10.1109/CCA.2010.5611246
conf/IEEEcca/2010
db/conf/IEEEcca/IEEEcca2010.html#WattamwarWB10
Satyajit Wattamwar
Siep Weiland
Ton Backx
Identification of low dimensional models for slow geometric parameter variation in an Industrial Glass Manufacturing Process.
989-994
2008
CCA
https://doi.org/10.1109/CCA.2008.4629689
conf/IEEEcca/2008
db/conf/IEEEcca/IEEEcca2008.html#WattamwarWB08
Ton Backx
Siep Weiland