Cathodic Protection Measurement and Modeling.

Erik K. Saathoff

Erik K. Saathoff Michael J. Bishop Isabelle C. Levitsky Jacob D. Skimmons Aaron W. Langham Steven B. Leeb Cathodic Protection Measurement and Modeling. 1-12 2025 74 IEEE Trans. Instrum. Meas. https://doi.org/10.1109/TIM.2024.3504558 db/journals/tim/tim74.html#SaathoffBLSLL25 streams/journals/tim

Adedayo O. Aderibole Erik K. Saathoff Kevin J. Kircher Aaron W. Langham Leslie K. Norford Steven B. Leeb Characterizing Low-Data-Rate Power Line Communication Channels. 1-12 2023 72 IEEE Trans. Instrum. Meas. https://doi.org/10.1109/TIM.2022.3225916 db/journals/tim/tim72.html#AderiboleSKLNL23

Erik K. Saathoff Daisy H. Green Rebecca A. Agustin Joseph W. O'Connell Steven B. Leeb Inrush Current Measurement for Transient Space Characterization and Fault Detection. 1-10 2021 70 IEEE Trans. Instrum. Meas. https://doi.org/10.1109/TIM.2021.3089226 db/journals/tim/tim70.html#SaathoffGAOL21

Erik K. Saathoff Steven R. Shaw Steven B. Leeb Line Impedance Estimation. 1-10 2021 70 IEEE Trans. Instrum. Meas. https://doi.org/10.1109/TIM.2020.3039642 db/journals/tim/tim70.html#SaathoffSL21

Adedayo O. Aderibole Rebecca A. Agustin Michael J. Bishop Daisy H. Green Kevin J. Kircher Aaron W. Langham Steven B. Leeb Isabelle C. Levitsky Leslie K. Norford Joseph W. O'Connell Steven R. Shaw Jacob D. Skimmons