Uwe Ritter
Ralf Richter
Stefan Dünkel
Bert Müller
Frank Mauersberger
Sven Wittek
Sven Beyer
Jana Böhme
Uwe Ritter
Violetta Sessi
Zhen Xu
Maximilian Drescher
Jinho Kim
Parviz Ghazavi
Yuri Tkachev
Latt Tee
Zonglin Li
Mandana Tadayoni
Fan Luo
Nhan Do
Serguei Jourba
Catherine Decobert
Gilles Festes
Bruno Villard
Thibaut Pate-Cazal
Performance and Reliability of Technology Qualified 34 Mb Split-Gate eFLASH Macro in 28 nm HKMG.
1-4
2024
IMW
https://doi.org/10.1109/IMW59701.2024.10536960
conf/imw2/2024
db/conf/imw2/imw2024.html#RichterDMMWBBRSXDKGTTLTLDJDFVP24
Sven Beyer
Jana Böhme
Catherine Decobert
Nhan Do
Maximilian Drescher
Stefan Dünkel
Gilles Festes
Parviz Ghazavi
Serguei Jourba
Jinho Kim
Zonglin Li
Fan Luo
Frank Mauersberger
Bert Müller
Thibaut Pate-Cazal
Ralf Richter
Violetta Sessi
Mandana Tadayoni
Latt Tee
Yuri Tkachev
Bruno Villard
Sven Wittek
Zhen Xu