Dimitrios E. Ioannou
Jeffrey A. Mittereder
Jason A. Roussos
Wallace T. Anderson
Dimitrios E. Ioannou
Quantitative measurement of channel temperature of GaAs devices for reliable life-time prediction.
482-485
2002
51
IEEE Trans. Reliab.
4
https://doi.org/10.1109/TR.2002.804487
db/journals/tr/tr51.html#MitterederRAI02
Wallace T. Anderson
Jason A. Roussos
Jeffrey A. Mittereder
Dimitrios E. Ioannou
C. Moglestue
Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study.
1109-1113
2001
41
Microelectron. Reliab.
8
https://doi.org/10.1016/S0026-2714(01)00082-8
db/journals/mr/mr41.html#AndersonRMIM01
Wallace T. Anderson
Jeffrey A. Mittereder
C. Moglestue
Jason A. Roussos