<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/chi/RamakersLKLHV23" mdate="2023-04-29">
<author orcid="0000-0001-6466-0663">Raf Ramakers</author>
<author orcid="0000-0002-0429-6537">Danny Leen</author>
<author orcid="0000-0002-8915-481X">Jeeeun Kim</author>
<author orcid="0000-0002-4194-1101">Kris Luyten</author>
<author orcid="0000-0002-9009-5706">Steven Houben</author>
<author orcid="0000-0002-0644-3254">Tom Veuskens</author>
<title>Measurement Patterns: User-Oriented Strategies for Dealing with Measurements and Dimensions in Making Processes.</title>
<pages>214:1-214:17</pages>
<year>2023</year>
<booktitle>CHI</booktitle>
<ee>https://doi.org/10.1145/3544548.3581157</ee>
<crossref>conf/chi/2023</crossref>
<url>db/conf/chi/chi2023.html#RamakersLKLHV23</url>
</inproceedings></dblp>
