Matthew P. Koehler
Kendall D. Hester
Matthew P. Koehler
Hanna Kanciak-Chwialkowski
Brian H. Jones
An assessment of the value of added screening of electronic components for commercial aerospace applications.
1823-1828
2001
41
Microelectron. Reliab.
11
https://doi.org/10.1016/S0026-2714(01)00113-5
https://www.wikidata.org/entity/Q127840261
db/journals/mr/mr41.html#HesterKKJ01
Kendall D. Hester
Brian H. Jones
Hanna Kanciak-Chwialkowski